41. Reliability of gallium arsenide MMICs
Author: edited by Aris Christou
Library: Central Library of Amirkabir University of Technology (Tehran)
Subject: Microwave integrated circuits - Reliability , Microwave integrated circuits - Testing , Gallium arsenide semiconductors - Reliability , Gallium arsenide semiconductors - Testing
Classification :
TK
7876
.
R445
42. Reliability of gallium arsenide mmics
Author: edited by: Aris christou
Library: (Semnan)
Subject: ، Microwave integrated circuits- Reliability,، Microwave integrated circuits- Testing,، Gallium aresenide semiconductors- Reliability
Classification :
TK
7876
.
R4
43. #Semiconductor device and failue analysis
Author: #Wai Kin Chim
Library: Central Library of Esfehan University of Technology (Esfahan)
Subject: Semiconductors- Failures ،Semiconductors- Testing ،Semiconductors- Microscopy ،Photon emission
Classification :
#
TK
،#.
C47
44. Semiconductor device and failure analysis using photon emission microscopy
Author: / Wai Kin Chim
Library: Central Library and Document Center of Shahid Chamran University (Khuzestan)
Subject: Semiconductors - Failures,Semiconductors - Testing,Semiconductors - Microscopy,Photon emission
Classification :
TK781
.
852
.
C47
2000
45. Semiconductor device and failure analysis using photon microscopy
Author: / by Wai Kin Chim
Library: Central Library, Center of Documentation and Supply of Scientific Resources (East Azarbaijan)
Subject: Semiconductors- Failures,Semiconductors- Testing,Semiconductors- Microscopy,Photon emission
Classification :
TK7871
.
85
.
C47
2000
46. Semiconductor devices in harsh conditions /
Author: edited by Kirsten Weide-Zaage and Malgorzata Chrzanowska-Jeske
Library: Center and Library of Islamic Studies in European Languages (Qom)
Subject: Environmental testing,Extreme environments,Semiconductors-- Reliability
Classification :
TK7871
.
85
.
S449
2017
47. Semiconductor devices measurements & tests
Author: GRIN,GRIGORY ISAAKOVICH
Library: Central Library of Amirkabir University of Technology (Tehran)
Subject: SEMICONDUCTORS , SEMICONDUCTORS TESTING , ELECTRIC MEASUREMENTS
Classification :
TK
7871
.
85
.
G674
1980
48. Semiconductor devices measurments and tests
Author: / [by] G. Grin translated from the Russain by Alexander repyev
Library: Tehran University, technical faculty libraries 1 (Tehran)
Subject: Semiconductors,Semicondcturs-testing
Classification :
TK
7871
.
85
.
G67413
49. Semiconductor devices measurments and tests
Author: / [by] G. Grin translated from the Russain by Alexander repyev
Library: Library of Campus2 Colleges of Engineering of Tehran University (Tehran)
Subject: Semiconductors,Semicondcturs-testing
Classification :
TK
7871
.
85
.
G67413
50. Semiconductor devices; testing and evaluation
Author: / C. E. Jowett
Library: Central Library and Archive Center of shahid Beheshti University (Tehran)
Subject: Semiconductors - Testing
Classification :
621
.
38152
Jo-S
51. Semiconductor devices : testing and evaluation
Author: Jowett, C. E, Charles Eric
Library: Central Library of Sharif University of Technology (Tehran)
Subject: ، Semiconductors-- Testing
Classification :
TK
7871
.
85
.
J68
52. Semiconductor devieas measurements and tests
Author: Grin, Grigorii Isaakovich.
Library: Central Library of Sharif University of Technology (Tehran)
Subject: ، Semiconductors,، Semiconductors-- Testing,، Electric measurements
Classification :
TK
7871
.
85
.
G67413
53. Semiconductor material and device characterization
Author: Schroder, Dieter K.
Library: Library of Niroo Research Institue (Tehran)
Subject: ، Semiconductors,، Semiconductors- Testing
Classification :
QC
611
.
S335
1990
54. Semiconductor material and device characterization
Author: Dieter K. Schroder,Title
Library: Library of Islamic Azad University, Qom branch (Qom)
Subject: Semiconductors,Semiconductors -- Testing
Classification :
QC
.
S335
611
2006
55. Semiconductor material and device characterization
Author: / by Dieter K Schroder
Library: Central Library, Center of Documentation and Supply of Scientific Resources (East Azarbaijan)
Subject: Semiconductors,Semiconductors- Testing,Semiconductors devices
Classification :
QC611
.
S335
1990
56. Semiconductor material and device characterization
Author: Dieter K.Schroder
Library: Vali Asr University Central Library (Kerman)
Subject: semiconductors,semiconductors-testing
Classification :
QC
611
.
S335
2005
57. Semiconductor material and device characterization
Author: / Dieter K. Schroder
Library: Central Library, Center of Documentation and Supply of Scientific Resources (East Azarbaijan)
Subject: Semiconductors,Semiconductors , Testing
Classification :
E-BOOK
58. Semiconductor material and device characterization
پدیدآورنده : Schroder, Dieter K.
موضوع : ، Semiconductors,، Semiconductors-- Testing
۷ نسخه از این کتاب در ۵ کتابخانه موجود است.
59. Semiconductor material and device characterization
Author: Schroder, Dieter K.
Library: Central Library and Information Center of Ferdowsi University of Mashhad (Khorasan Razavi)
Subject: ، Semiconductors,Testing ، Semiconductors
Classification :
QC
611
.
S335
1998
60. Semiconductor material and device characterization
Author: / Dieter K. Schroder
Library: Central Library, Center of Documentation and Supply of Scientific Resources (East Azarbaijan)
Subject: Semiconductors,Semiconductors- Testing
Classification :
QC611
.
S335
2006
